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A Quantum Mechanical Approach for the Simulation of Si/SiO2 Interface Roughness Scattering in Silicon Nanowire Transistors

What this record says

In this work, we present a quantum mechanical approach for the simulation of Si/SiO2 interface roughness scattering in silicon nanowire

CATALOG · The abstract is indexed.

Sources and freshness

Search projection 8a339e17 · indexed Sep 11, 2026